EMC compliance testing of a manufacturer’s product can be quite costly and time-consuming, especially if the initial submission of the product fails at the test house, leading to the manufacturer ...
Design verification has been the dominant portion of chip development for years, and the challenges grow bigger every day. Single dies continue to grow in transistor count and complexity. Advanced ...
Getting an integrated circuit (IC) from design to test is an arduous process that encompasses a number of steps, including: This is an iterative process and can take months, so every step should be ...
The Nebula silicon debugger speeds test-vector debug time from weeks to half a day through its direct knowledge of on-chip design-for-test (DFT) structures and integrated use of Synopsys' TetraMAX ...
FREIBURG, Germany--(BUSINESS WIRE)--Concept Engineering, leaders in visualization and debugging technology for electronic circuits and systems, will unveil version 6.9 of the company's popular Vision ...
Verification takes as much as 70% of an ASIC's development time and resources. With growing ASIC complexity, verification problems are growing exponentially. Given the high cost of ASIC mask sets, the ...
ANAHEIM, Calif. — At an open Design Automation Conference (DAC) meeting held here Monday (June 13), representatives from the semiconductor design, manufacturing test and silicon debug supply chain ...
AUSTIN, Texas--(BUSINESS WIRE)--NIWeek – NI (Nasdaq: NATI), the provider of a software-defined platform that helps accelerate the development and performance of automated test and automated ...
TOKYO, May 08, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today unveiled SiConic Test Engineering (TE), the newest addition to the SiConic ...
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