DALLAS — Reliability experts are waving red flags about a little understood problem — negative bias temperature instability — that can cause significant delays to CMOS circuits. The delays increase ...
As electronic content in vehicles continues to rise, designers must find solutions for reliability under intense heat, advises Daren McClearnon. Heat kills semiconductors and automotive environments ...
San Francisco — The stresses on deep-submicron CMOS — especially the newest 90-nanometer ICs — are starting to resemble a chamber of horrors. Leakage currents, authorities believe, can be tamed by ...
Toshiba will deploy Cadence's Virtuoso UltraSim Full-Chip Simulator among its analog and mixed-signal chip designers to conduct reliability analysis at 65 nanometers and below. The companies worked ...
As author R. Jacob “Jake” Baker points out in the preface to this comprehensive volume, CMOS technology has dominated the fabrication of ICs for 25 years, and is likely to dominate it for another 25 ...
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