In transmission electron microscopy (TEM), where the electron beam passes through the sample to be directly imaged on the detector below, it is often necessary to support the thin samples on a grid.

The 2D materials comprise a single or double layer of atoms, so investigating their properties requires the use of electron microscopy. Point defects—such as missing atoms—can be instrumental in ...

Researchers have designed a new electron cryo-microscope that is a fraction of the size and cost of current alternatives and used it to determine 11 atomic structures. The breakthrough aims to slash ...

Electron microscopy (EM) has become an indispensable tool for investigating the nanoscale structure of a large range of materials, across physical and life sciences. It is vital for characterisation ...

Working on the nanoscale for manufacturing poses some unique challenges. While many macroscale manufacturing methods such as lithography and additive manufacturing have been successfully translated ...

The US has installed a custom-made electron microscope that has the potential to transform ...

Brookhaven Lab's new electron microscope delivers 200x sharper energy resolution, enabling simultaneous atomic analysis of ...

What really happens when a blade cuts through metal? An engineer builds a custom device capable of cutting aluminum inside a scanning electron microscope, then captures approximately 70 images over a ...