Abstract: In this paper, we investigate a new operating mode for 3D-NAND flash cell programming and erasing. Whereas conventional flash cells are operated by injecting charges from the channel, this ...
Abstract: In this research, a compact model is proposed for trap-assisted tunneling (TAT) currents in 3-D NAND flash memory during erase/write (EW) cycling. Using the trap spectroscopy by charge ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results